【For Mid-level】DC Measurement for Semiconductors: Open Short and Leak Test
Guide to Semiconductor Test Programs Using "LabVIEW" - DC Measurement Edition
We present a practical programming guide useful in the manufacturing field for mid-level engineers. This time, we will cover how to create a program for conducting open-short-leak tests on semiconductors. Engineers at semiconductor manufacturers are troubled by inspection speed and inspection accuracy. This is recommended for those who want to engage in deeper discussions with equipment manufacturers about inspection speed and accuracy, and for those who want to customize the process themselves. In this text, we will explain how to create a DC test program using measuring instruments and real optocouplers that are used in the field. This is a must-check for anyone involved in semiconductors!
- Company：ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
- Price：Other
